Wheat crop traits conferring high yield potential may also improve yield stability under climate change

  1. Stella, Tommaso
  2. Webber, Heidi ORCID logo
  3. Rezaei, Ehsan Eyshi
  4. Asseng, Senthold
  5. Martre, Pierre ORCID logo
  6. Dueri, Sibylle
  7. Guarin, Jose Rafael
  8. Pequeno, Diego N. L.
  9. Calderini, Daniel F.
  10. Reynolds, Matthew Paul ORCID logo
  11. Molero, Gemma
  12. Miralles, Daniel
  13. Garcia, Guillermo
  14. Slafer, Gustavo
  15. Giunta, Francesco
  16. Kim, Yean-Uk
  17. Wang, Chenzhi
  18. Ruane, Alex C.
  19. Ewert, Frank ORCID logo

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1000 Titel
  • Wheat crop traits conferring high yield potential may also improve yield stability under climate change
1000 Autor/in
  1. Stella, Tommaso |
  2. Webber, Heidi |
  3. Rezaei, Ehsan Eyshi |
  4. Asseng, Senthold |
  5. Martre, Pierre |
  6. Dueri, Sibylle |
  7. Guarin, Jose Rafael |
  8. Pequeno, Diego N. L. |
  9. Calderini, Daniel F. |
  10. Reynolds, Matthew Paul |
  11. Molero, Gemma |
  12. Miralles, Daniel |
  13. Garcia, Guillermo |
  14. Slafer, Gustavo |
  15. Giunta, Francesco |
  16. Kim, Yean-Uk |
  17. Wang, Chenzhi |
  18. Ruane, Alex C. |
  19. Ewert, Frank |
1000 Erscheinungsjahr 2023
1000 LeibnizOpen
1000 Publikationstyp
  1. Artikel |
1000 Online veröffentlicht
  • 2023-09-15
1000 Erschienen in
1000 Quellenangabe
  • 5(2):diad013
1000 FRL-Sammlung
1000 Copyrightjahr
  • 2023
1000 Lizenz
1000 Verlagsversion
  • https://doi.org/10.1093/insilicoplants/diad013 |
1000 Publikationsstatus
1000 Begutachtungsstatus
1000 Sprache der Publikation
1000 Abstract/Summary
  • Increasing genetic wheat yield potential is considered by many as critical to increasing global wheat yields and production, baring major changes in consumption patterns. Climate change challenges breeding by making target environments less predictable, altering regional productivity and potentially increasing yield variability. Here we used a crop simulation model solution in the SIMPLACE framework to explore yield sensitivity to select trait characteristics (radiation use efficiency [RUE], fruiting efficiency and light extinction coefficient) across 34 locations representing the world’s wheat-producing environments, determining their relationship to increasing yields, yield variability and cultivar performance. The magnitude of the yield increase was trait-dependent and differed between irrigated and rainfed environments. RUE had the most prominent marginal effect on yield, which increased by about 45 % and 33 % in irrigated and rainfed sites, respectively, between the minimum and maximum value of the trait. Altered values of light extinction coefficient had the least effect on yield levels. Higher yields from improved traits were generally associated with increased inter-annual yield variability (measured by standard deviation), but the relative yield variability (as coefficient of variation) remained largely unchanged between base and improved genotypes. This was true under both current and future climate scenarios. In this context, our study suggests higher wheat yields from these traits would not increase climate risk for farmers and the adoption of cultivars with these traits would not be associated with increased yield variability.
1000 Sacherschließung
lokal wheat
lokal Climate change
lokal climate risk
lokal yield variability
lokal genetic yield potential
1000 Fächerklassifikation (DDC)
1000 Liste der Beteiligten
  1. https://frl.publisso.de/adhoc/uri/U3RlbGxhLCBUb21tYXNv|https://orcid.org/0000-0001-8301-5424|https://frl.publisso.de/adhoc/uri/UmV6YWVpLCBFaHNhbiBFeXNoaQ==|https://frl.publisso.de/adhoc/uri/QXNzZW5nLCBTZW50aG9sZA==|https://orcid.org/0000-0002-7419-6558|https://frl.publisso.de/adhoc/uri/RHVlcmksIFNpYnlsbGU=|https://frl.publisso.de/adhoc/uri/R3VhcmluLCBKb3NlIFJhZmFlbA==|https://frl.publisso.de/adhoc/uri/UGVxdWVubywgRGllZ28gTi4gTC4=|https://frl.publisso.de/adhoc/uri/Q2FsZGVyaW5pLCBEYW5pZWwgRi4=|https://orcid.org/0000-0002-4291-4316|https://frl.publisso.de/adhoc/uri/TW9sZXJvLCBHZW1tYQ==|https://frl.publisso.de/adhoc/uri/TWlyYWxsZXMsIERhbmllbA==|https://frl.publisso.de/adhoc/uri/R2FyY2lhLCBHdWlsbGVybW8=|https://frl.publisso.de/adhoc/uri/U2xhZmVyLCBHdXN0YXZv|https://frl.publisso.de/adhoc/uri/R2l1bnRhLCBGcmFuY2VzY28=|https://frl.publisso.de/adhoc/uri/S2ltLCBZZWFuLVVr|https://frl.publisso.de/adhoc/uri/V2FuZywgQ2hlbnpoaQ==|https://frl.publisso.de/adhoc/uri/UnVhbmUsIEFsZXggQy4=|https://orcid.org/0000-0002-4392-8154
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1000 Erstellt am 2023-11-15T13:07:21.296+0100
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